X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-11-20
2007-11-20
Song, Hoon (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S145000
Reexamination Certificate
active
11491462
ABSTRACT:
An X-ray optical element for and influencing of X-ray beam characteristics in two dimensions includes two reflective, curved elements arranged side-by-side to receive X-ray radiation from an X-ray beam source so that the radiation is directed onto both reflective elements and then reflected from one element onto the other element, wherein the two reflective elements are curved at different angles and have different focal lengths.
REFERENCES:
patent: 6249566 (2001-06-01), Hayashi et al.
patent: 6377655 (2002-04-01), Murakami et al.
patent: 2006/0018429 (2006-01-01), Hoghoj et al.
Dietsch Reiner
Holz Thomas
AXO Dresden GmbH
Fay Kaplun & Marcin, LLP.
Song Hoon
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