X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-10-10
2009-06-02
Glick, Edward J (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S044000, C378S070000
Reexamination Certificate
active
07542548
ABSTRACT:
An X-ray optical system provides selectively a linear X-ray beam and a point X-ray beam while using an X-ray source which generates an X-ray beam having a linear section. When the point X-ray beam is selected, an X-ray intensity per unit area becomes higher. The X-ray optical system has an X-ray source, a parabolic multilayer mirror to which an aperture slit plate is attached, an optical-path selection slit device, a polycapillary optics and an exit-width restriction slit. The polycapillary optics and the exit-width restriction slit are detachably inserted into a path of a parallel beam coming from the parabolic multilayer mirror, and thus they can be removed from the path and a Soller slit and a divergence slit can be inserted instead.
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Extended European Search Report dated Feb. 8, 2008 issued in counterpart European Application.
Echizenya Akira
Fujinawa Go
Matsuo Ryuji
Artman Thomas R
Frishauf Holtz Goodman & Chick P.C.
Glick Edward J
Rigaku Corp.
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