X-ray optical system with wobble device

Details X-ray optical system with wobble device X-ray optical system with wobble device

2006-02-07

2006-02-07

Bruce, David V. (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S155000, C378S150000

Reexamination Certificate

active

06996208

ABSTRACT:
An X-ray optical system comprising an X-ray source (1), from which X-ray radiation (2) is guided to a sample (4) under investigation, and an X-ray detector (7) for receiving radiation (5) diffracted or scattered from the sample (4), wherein a beam-guiding X-ray optical element (3, 6), such as e.g. a collimator, a mono- or polycapillary, an X-ray mirror or a monochromator, is disposed between the source (1) and the sample (4) and/or between the sample (4) and the detector (7), is characterized in that a wobble means is provided for moving the X-ray optical element (3, 6) in an oscillating fashion during the measurement. The inventive X-ray optical system obtains averaged X-ray analysis information from objects under investigation having large mass which consist of macrocrystalline material without destroying or accelerating the object under investigation.

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patent: 195 36 822 (1997-04-01), None
patent: WO 00/05 727 (2000-02-01), None
“ATX-G Optical System”. The Rigaku Journal, vol. 16, no. 1, 1999, pp. 53-58.
“Diffraction Solutions für die Materialuntersuchung-D8 Discover”, Bruker AXS, pp. 10-15 Apr. 2000.

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