X-ray optical element and diffractometer with a soller slit

Details X-ray optical element and diffractometer with a soller slit X-ray optical element and diffractometer with a soller slit

2011-07-19

2011-07-19

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S147000

Reexamination Certificate

active

07983389

ABSTRACT:
An X-ray optical element (1, 1′, 1″) with a Soller slit comprising several lamellas for collimating an X-ray beam with respect to the direction of the axis (5, 15) of the Soller slit, and a further collimator for delimiting an X-ray (10), wherein the further collimator is rigidly connected to the Soller slit (2, 14) during operation, is characterized in that the X-ray beam (10) delimited by the further collimator intersects the axis (5, 15) of the Soller slit within the Soller slit, and the direction of the X-ray beam (10) subtends an angle α≧10° with respect to the axis (5, 15) of the Soller slit. An X-ray optical element (1, 1′, 1″) with a Soller slit (2, 14) and a further collimator is thereby realized, which permits automatic change between the Soller slit (2, 14) and the further collimator.

REFERENCES:
patent: 6266392 (2001-07-01), Fujinawa
patent: 6307917 (2001-10-01), Shimizu et al.
patent: 6444993 (2002-09-01), Kogan
patent: 6665372 (2003-12-01), Bahr
patent: 6807251 (2004-10-01), Okanda
patent: 2005/0281382 (2005-12-01), Inneman
patent: 2007/0086567 (2007-04-01), Kataoka
patent: 2008/0056452 (2008-03-01), Sasaki
patent: 2008/0084967 (2008-04-01), Matsuo et al.
“Diffraction Solutions D8 Advance” Company Broshure, Bruker AXS, Karlsruhe Germany, 2002.

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