LandOfFree - US Patents - Listing for X-ray or gamma ray systems or devices,Specific application,Diffraction, reflection, or scattering analysis

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for measurement of physical characteristics of crystals

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for measuring and extending the service life of fatigue-l

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for measuring coating thickness

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for measuring dead time of X-ray detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for measuring dead time of X-ray detector

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for measuring powder x-ray diffraction data using...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for monitoring the crystallographic texture of metallic t

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for obtaining the image of the internal structure of an o

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for obtaining the image of the internal structure of an o

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for operating a primary beam stop

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for the determination of the spatial distribution of the

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for the on-line nondestructive measurement of a character

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for using secondary radiation scattering to evaluate the

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for X-ray micro-diffraction measurement and X-ray...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for X-ray reflectance measurement

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method for X-ray wavelength measurement and X-ray wavelength...

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of analyzing composition of optical fiber base material t

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of bright-field imaging using X-rays

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Method of determining a given characteristic of a material sampl