X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1994-05-18
1996-02-06
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 70, G01N 2320
Patent
active
054901952
ABSTRACT:
Improved methods for managing a population of metal components subject to fatigue failure are provided. The residual compressive stress in the critical surfaces of such components, especially in areas of high stress concentration, are measured non-destructively using x-ray diffraction techniques. The measured residual compressive stress is used as a management criteria. A component having a residual compressive stress greater than a predetermined value can be returned to service. However, once the measured residual compressive stress of a component galls below the predetermined value, it can either be removed permanently from service, or it can be reworked to increase its residual compressive stress and then returned to service. Additionally, by measuring the residual compressive stress of an individual component, the remaining service life of that individual component can be estimated. These methods for management of populations of such metal components allow for increasing the service life of the components in a safe and effective manner.
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Fatigue Management Associates LLC
Porta David P.
Wong Don
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