Method of bright-field imaging using X-rays

Details Method of bright-field imaging using X-rays Method of bright-field imaging using X-rays

2011-03-08

2011-03-08

Yun, Jurie (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S084000

Reexamination Certificate

active

07903785

ABSTRACT:
Provided is a method of bright-field imaging using x-rays in a sample to reveal lattice defects as well as structural inhomogeneities, the method comprising: (a) disposing a sample on a holder in the Laue transmission geometry and setting the sample to a single reflection in the Bragg diffraction; (b) projecting a beam of monochromatic x-rays on the sample; and (c) obtaining transmitted radiographic images and reversed diffracted images of the projected beam of monochromatic x-rays by the sample, respectively.

REFERENCES:
patent: 5016267 (1991-05-01), Wilkins
patent: 5148457 (1992-09-01), Kubota et al.
patent: 5802137 (1998-09-01), Wilkins
patent: 5850425 (1998-12-01), Wilkins

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