Method for measuring dead time of X-ray detector

Details Method for measuring dead time of X-ray detector Method for measuring dead time of X-ray detector

2008-03-11

2008-03-11

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

C378S116000

Reexamination Certificate

active

11435237

ABSTRACT:
The dead time of a pulse type X-ray detector is measured without estimation of a true X-ray intensity. The first and the second conditions are used for varying an intensity of an X-ray entering the X-ray detector. The first condition may be the slit width of a receiving slit, at least three kinds of slit width being selected. The second condition may be with or without an absorption plate. The first observed X-ray intensities are observed, with the absorption plate inserted, for three or more values in slit width. Next, the second observed X-ray intensities are observed similarly but with the absorption plate removed. A predetermined relational expression is made up among the first observed X-ray intensity, the second observed X-ray intensity, a ratio k of the second observed X-ray intensity to the first observed X-ray intensity (depending upon attenuation in X-ray intensity caused by the absorption plate) and the dead time τ of the X-ray detector. Based on the relational expression, a fitting operation is carried out with the least squares method so as to determine the dead time τ precisely.

REFERENCES:
Elements of X-ray Diffraction, Second Edition, written by B.D. Cullity, Japanese Version, translated by G. Matsumura, published by Agune (Japan), 1980, pp. 179-183.
Elements of X-ray Diffraction, Second Edition, written by B.D. Cullit, Addison-Wesley Publishing Company, Inc. 1978, pp. 199-203.
Experimental Physics Course 20, X-ray Diffraction, edited by K. Kohra, published by Kyoritsu Shuppan (Japan), 1988, pp. 147-148 and 189, and its English translation of the related part.
Bonetto et al, “Measuring the Dead Time of an X-Ray Spectrometer by Means of the First- and Second-Order Reflections Method”, X-Ray Spectrometry, vol. 13, No. 1, 1984, pp. 44-45.
Adams et al, “Deadtime of scintillation camera systems-definitions, measurement and applications”, Medical Physics, vol. 1, No. 4, Jul./Aug. 1974, pp. 198-203.
Meray, L., “Measurement of the dead time of XRF Detection Systems Using a Pulsed Beam”, X-Ray Spectrometry, vol. 17, Feb. 1988, pp. 19-21.

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