Method for monitoring the crystallographic texture of metallic t

Details Method for monitoring the crystallographic texture of metallic t Method for monitoring the crystallographic texture of metallic t

1985-01-25

1987-12-22

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 71, G01N 23207

Patent

active

047150530

ABSTRACT:
The crystallographic texture of metallic tubular articles is characterized by an X-ray diffraction technique where X-rays are directed onto the surface of the tubular article and diffracted X-rays detected by use of a position-sensitive detector. By effecting relative movement of the tubular article and the X-ray source in both a rotational direction about the axis of the tube and in an axial direction, and measuring intensities from multiple Bragg peaks of the diffracted X-rays from a plurality of locations on the tube, the crystallographic texture of the tube is characterized.

REFERENCES:
patent: 2504389 (1950-04-01), Brosky
patent: 2798163 (1957-07-01), Nishigaki
patent: 3483377 (1969-12-01), Borkowski et al.
patent: 3934138 (1976-01-01), Bens
patent: 4095103 (1978-06-01), Cohen et al.
patent: 4307364 (1981-11-01), Goebel
"Micro X-Ray Diffraction Camera . . . Single Microcrystals" by Glas E. Scientific Instruments, 1962, vol. 39.
"Thermal Expansion and Preferred Orientation in Zircaloy", J. J. Kearns, WAPD-TM-472, Nov. 1965.
"The Measurement of Residual Stresses with X-Rays"; J. B. Cohen, M. R. James, and B. A. MacDonald, Naval Research Reviews, Nov. 1978, pp. 1-18.

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