Method for the determination of the spatial distribution of the

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

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378 86, G01N 23201

Patent

active

047544694

ABSTRACT:
The invention relates to a method for determination of the cross-sections for elastic scattered radiation in which a polychromatic radiation source is used but in which good differentiation between various substances is still possible.

REFERENCES:
patent: 3936638 (1976-02-01), Gibbons
patent: 4028554 (1977-06-01), Hounsfield
patent: 4121098 (1978-10-01), Jagoutz et al.
patent: 4123654 (1978-10-01), Reiss et al.

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