X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1986-07-11
1988-06-28
Howell, Janice A.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 86, G01N 23201
Patent
active
047544694
ABSTRACT:
The invention relates to a method for determination of the cross-sections for elastic scattered radiation in which a polychromatic radiation source is used but in which good differentiation between various substances is still possible.
REFERENCES:
patent: 3936638 (1976-02-01), Gibbons
patent: 4028554 (1977-06-01), Hounsfield
patent: 4121098 (1978-10-01), Jagoutz et al.
patent: 4123654 (1978-10-01), Reiss et al.
Harding Geoffrey
Kosanetzky Josef-Maria
Neitzel Ulrich
Freeman John C.
Howell Janice A.
Miller Paul R.
U.S. Philips Corp.
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