Method of analyzing composition of optical fiber base material t

Details Method of analyzing composition of optical fiber base material t Method of analyzing composition of optical fiber base material t

1985-10-11

1989-11-28

Church, Craig E.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 85, 378 53, 378 54, 2503581, G01T 136

Patent

active

048842907

ABSTRACT:
A method of analyzing a composition of an optical fiber base material to be measured by radioactive rays, which comprises the steps of irradiating radioactive rays from a radiation generator to the composition containing a plurality of elements or the substance, emitting the transmitted rays of the base material to a plurality of single crystals to produce several types of transmitted rays of specific energy, and measuring the transmitted rays by a radiation detector to analyze the compositions of the constituent elements in the base material. Thus, this method can accurately and economically analyze the composition in response to the constituent elements of the composition and the thickness of the composition.

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