Method for using secondary radiation scattering to evaluate the

Details Method for using secondary radiation scattering to evaluate the Method for using secondary radiation scattering to evaluate the

1992-04-24

1993-03-16

Hannaher, Constantine

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 86, 378 70, G01N 23201

Patent

active

051951177

ABSTRACT:
A method for using secondary radiation scattering to evaluate the thickness of materials. The thickness of a first material adjacent to a second material may be evaluated by bombarding the first material with radiation and measuring the radiation scattered by the second material behind it. The method is particularly useful in evaluating the thickness of hydrocarbon-carrying pipelines.

REFERENCES:
patent: 22531 (1944-08-01), Hare
patent: 3846631 (1974-11-01), Kehler
patent: 4525845 (1985-06-01), Molbert et al.
Lott et al., "Near Real-time Radiologic Corrosion Monitoring of Arctic Petroleum Gathering Lines" Materials Evaluation, Mar. 1985.
Harding et al., "X-ray Imaging with Compton-scatter Radiation," Phillips Tech. Rev. 41 (1983): 46-59.

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