X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1995-07-11
1996-11-26
Church, Craig E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 85, 378 82, G21K 106
Patent
active
055793630
ABSTRACT:
This invention relates to nondestructive testing of the internal structure of objects.
The method for obtaining the image of The internal structure of an object consists in that the flux of a penetrating radiation emitted by a source (1) is collimated by a single-crystal monochromator (4), an object (7) is irradiated with the thus-collimated radiation, the radiation transmitted through the object (7) is collimated by a single-crystal (8) and then registered by a detector (9). According to the invention, use is made for irradiating the object, of an asymmetrical reflection of the radiation from the single-crystal monochromator (4), a pseudosheet-like beam (5) is formed, having a wide wavefront and a divergence in the Bragg diffraction plane at least twice as little as the width of the Bragg reflection of the single-crystal (8), which is set in the position of Bragg reflection with respect to the pseudosheet-like beam (5) formed by the single-crystal monochromator (4).
The method is aimed preferably for diagnosing polymer and ceramic products, as well as for medical diagnosis.
REFERENCES:
patent: 5319694 (1994-06-01), Ingal et al.
Belyaevskaya Elena A.
Efanov Valery P.
Ingal Viktor N.
Church Craig E.
Grossman Paul D.
V-Ray Imaging Corporation
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