Method for the on-line nondestructive measurement of a character

Details Method for the on-line nondestructive measurement of a character Method for the on-line nondestructive measurement of a character

1992-02-13

1994-12-13

Dzierzynski, Paul M.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

364472, 364507, G01N 2320

Patent

active

053735455

ABSTRACT:
The process measures a characteristic (X) which is difficult to measure of a continuously produced product and comprises:

REFERENCES:
patent: 3869892 (1975-03-01), Higham et al.
patent: 3956631 (1976-05-01), Crosby, Jr.
patent: 4073007 (1978-02-01), Boivin
patent: 5308010 (1994-05-01), Hakiel
Patent Abstracts of Japan, vol. 5, No. 21 (P-48) [693], Feb. 7, 1981, & JP-A 55-149031, Nov. 20, 1980, S. Shida, et al., "Shape Detecting Method of Rolled Plate".
Materiaux Et Techniques, Sep.-Oct. 1988, Paris, FR, pp. 5-12, G. Maeder, "Developpements Actuels De La Determination Des Contraintes Par Diffraction Des Rayons X".

Affiliated with

Also associated with

Rating

Method for the on-line nondestructive measurement of a character does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for the on-line nondestructive measurement of a character, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for the on-line nondestructive measurement of a character will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1198504