X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2007-08-28
2007-08-28
Thomas, Courtney (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S071000, C378S086000
Reexamination Certificate
active
11236651
ABSTRACT:
An X-ray or neutron-optical analysis device comprising means for directing radiation from a source (1) onto a sample (2), and a detector (7) with n substantially identical detector elements (Di) which are disposed parallel, next to each other in a first direction x and which extend in strips in a second direction y, wherein i=1, . . . n, for one-dimensional spatially-resolved detection of radiation reflected, scattered or diffracted by the sample (2) onto the detector (7), and with a detection electronics for processing the detector signals of the n detector elements (Di), wherein the detection electronics can reliably process a maximum radiation intensity per detector element (Di) without overloading, is characterized in that an optical element is disposed in front of the detector (7) which covers or weakens radiation incident on the surfaces of the respective n detector elements (Di) in correspondence with a predetermined, non-constant transmission function f(x) and/or the optical element comprises a collimator (6) which can be displaced along the strip direction y. The inventive analysis device permits artificial enlargement of the dynamic range of the detector (7).
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Bruegemann Lutz
Eisenhower Rachel
Gerndt Ekkehard
Grybos Pawel
Kasten Arne
Bruker AXS GmbH
Thomas Courtney
Vincent Paul
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