X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1999-11-30
2000-09-12
Bruce, David V.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 82, G01T 136
Patent
active
061188506
ABSTRACT:
Energy dispersive x-ray diffraction spectra are obtained from numerous volume elements within an object. A feature set such as a set of cepstrum coefficients is extracted from each spectrum and classified by a trained classifier such as a neural network to provide an indication of whether or not contraband such as explosives is present in the volume element. Indications for adjacent volume elements are evaluated in conjunction with one another, as by an erosion process, to suppress isolated indications and thereby suppress false alarms.
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Croft Mark C.
Fineberg Adam B.
Kalman Zwi
Mammone Richard
Mayo William E.
Bruce David V.
Rutgers The State University
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