Analysis methods for energy dispersive X-ray diffraction pattern

X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

378 82, G01T 136

Patent

active

061188506

ABSTRACT:
Energy dispersive x-ray diffraction spectra are obtained from numerous volume elements within an object. A feature set such as a set of cepstrum coefficients is extracted from each spectrum and classified by a trained classifier such as a neural network to provide an indication of whether or not contraband such as explosives is present in the volume element. Indications for adjacent volume elements are evaluated in conjunction with one another, as by an erosion process, to suppress isolated indications and thereby suppress false alarms.

REFERENCES:
patent: 5007072 (1991-04-01), Jenkins et al.
patent: 5008911 (1991-04-01), Harding
patent: 5231652 (1993-07-01), Harding
patent: 5265144 (1993-11-01), Harding et al.
patent: 5394453 (1995-02-01), Harding
patent: 5481476 (1996-01-01), Windig
patent: 5634087 (1997-05-01), Mammone et al.
Improvement of the Quality of the Data Collected Using a Position-Sensitive Detector, Nuclear Instruments and Methods, vol. 201, (1982), pp. 117-122.
Energy-Dispersive X-Ray Diffraction Tomography, Phys. Med. Biol., vol. 35, No. 1, (1990) pp. 33-41.
Optimization Criteria for CXRS Baggage Inspection, SPIE, vol. 2511, pp. 64-70 (1995).
Scattered X-Ray Beam Nondestructive Testing, Nuclear Instruments and Methods in Physics Research A, vol. 280, (1989) pp. 517-528.
Adaptation of Solid State Detector in X-Ray Powder Diffractometry, X-Ray Spectrometry 1 pp. 8249-8254.(1972).
On The Use of Wide Angle Energy-Sensitive Detectors in White-Beam X-Ray Single Crystal Diffraction, Nuclear Instruments and Methods, vol. 178, (1980), pp. 131-135.
Single and Segmented High Purity Germanium Detectors for Industrial and Medical Applications, Nuclear Techniques for Analytical and Industrial Applications, (1993) pp. 171-174.
Evaluation of High-Pressure X-Ray Diffraction Data from Energy-Dispersive Conical-Slit Equipment, High Temperatures-High Pressures, vol. 16, (1984) pp. 501-505.
Scattered X-Ray Beam Non-Destructive Testing, Nuclear Instruments and Methods in Physics Research A280, (1989) pp. 517-528.
Detection of Explosives in Airport Baggage Using Coherent X-Ray Scatter, SPIE, vol. 2092, Substance Detection Systems, (1993), pp. 399-410.
X-Ray Diffraction: New High-Speed Technique Based on X-Ray Spectrography, Science, vol. 159, No. 2818, Mar. 1, 1968, pp. 973-975.
Bibliography: The Energy Dispersive X-Ray Diffraction Method: Annotated Bibliography 1968-78, Journal of Materials Science 15 (1980) pp. 269-278.
Status and Outlook of Coherent-X-Ray Scatter Imaging, Optical Society of America, May 1987, vol. 4, No. 5, pp. 933-944.
Superior Court of New Jersey, Appellate Division, Docket No. A-7108-96T5, Defendants-Appellants' Brief, Apr. 30, 1998.
Superior Court of New Jersey, Appellate Division, Docket No. A-7108-96T5, Brief of Plaintiff-Respondent Rutgers, the State University, Jun. 15, 1998.
Superior Court of New Jersey, Law Division: Middlesex County, Docket No. L-113895, Final Order and Judgment, filed Jul. 7, 1997.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Analysis methods for energy dispersive X-ray diffraction pattern does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Analysis methods for energy dispersive X-ray diffraction pattern, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Analysis methods for energy dispersive X-ray diffraction pattern will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-103042

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.