X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1981-08-03
1983-10-25
Smith, Alfred E.
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
356 31, 378 81, G01N 2320
Patent
active
044123450
ABSTRACT:
An apparatus and method for precisely measuring the angles of cut of single nd doubly rotated cuts of quartz crystal blanks on a high volume production basis.
REFERENCES:
patent: 2392528 (1946-01-01), Fankuchen
patent: 2457555 (1948-12-01), Haworth
patent: 4065211 (1977-12-01), Vig
Chambers John L.
Pugh Myron A.
Ward Roger W.
Workman S. Thomas
Gibson Robert P.
Grigsby T. N.
Murray Jeremiah G.
Redman John W.
Smith Alfred E.
LandOfFree
Apparatus and method for precise determinations of crystallograp does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Apparatus and method for precise determinations of crystallograp, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Apparatus and method for precise determinations of crystallograp will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-716067