X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Patent
1997-11-17
1999-12-21
Bruce, David Vernon
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
378 98, 378 99, 600425, 600437, G01N 23201
Patent
active
060059168
ABSTRACT:
An apparatus and method for rapid real time imaging with wavefield energy using a C.P.U. programmed to process data derived from wavefield energy that has been transmitted and scattered by an object so as to reconstruct a wavefield image of the object. Electronic signals are propagated and are transduced into wavefield energy waves which in turn are propagated toward the object. Detectors detect the wavefield energy waves scattered by the object. The detected wavefield energy waves are then electronically processed and input into a high-speed digital computer which may comprise a C.P.U. and/or a C.P.U. in combination with an array or parallel processor. Data is also prepared and input to the computer representing the incident field and the computer then reconstructs a high-quality image of the object having high spacial resolution and including actual properties of the object. The media in which the object is embedded may be fluid or solid, homogeneous, or layered (such as stratigraphic layering, or ocean velocity layers, or layering of composites in nondestructive imaging applications), or may consist of porous material (either sedimentary deposits or composites in nondestructive testing).
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Wilcox, C.H., "U
Borup David T.
Johnson Steven A.
Natterer Frank
Olsen Scott Charles
Wiskin James W.
Bruce David Vernon
Techniscan, Inc.
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