X-ray or gamma ray systems or devices – Specific application – Diffraction – reflection – or scattering analysis
Reexamination Certificate
2005-01-04
2005-01-04
Church, Craig E. (Department: 2882)
X-ray or gamma ray systems or devices
Specific application
Diffraction, reflection, or scattering analysis
C378S088000, C378S057000
Reexamination Certificate
active
06839406
ABSTRACT:
A method and an apparatus for detecting items in objects, such as in luggage, wherein a detector apparatus, functioning as a second detector is divided into a lower testing stage and a higher testing stage. In the lower testing stage, the coordinates of the object location are determined, and subsequently, a diffraction apparatus is moved to this location in the higher testing stage. In particular, X-ray diffraction can be employed to determine the explosive material of the item in the object. The diffraction apparatus comprises a collimator/detector arrangement, which is disposed to be adjusted height-wise and laterally in the higher testing stage, with a laterally-adjustable X-ray source, which is synchronized with the collimator/detector arrangement. The collimator/detector arrangement preferably has only one collimator and one detector. The collimator preferably has a conically-expanding ring slot, which a predetermined angle ΘMof a scatter radiation.
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http://www.heimannsystems.com
ewsar.htm, accessed Nov. 6, 2001 (see “Worldwide leadership in X-ray diffraction technology confirmed”).
Cordes Frank
Hartick Martin
Ries Hermann
Schall Patricia
Church Craig E.
Kao Chih-Cheng Glen
Smiths Heimann GmbH
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