Angle dispersive x-ray spectrometer

Details Angle dispersive x-ray spectrometer Angle dispersive x-ray spectrometer

1997-06-17

1999-07-13

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Diffraction, reflection, or scattering analysis

378 83, G21K 106

Patent

active

059237201

ABSTRACT:
An x-ray spectrometer is provided comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved crystal monochromator comprising a shape which is substantially identical to a logarithmic spiral, and a position-sensitive x-ray detector. A method of measuring diffraction intensities from oriented samples in real time including providing an x-ray spectrometer comprising an X-ray source, a curved crystal monochromator which focuses a monochromatic x-ray beam onto a sample surface, the curved monochromator comprising the shape of a logarithmic spiral, and a position-sensitive x-ray detector; and providing a crystallographically oriented sample, exposing the sample to the focused x-ray beam of the x-ray spectrometer; and measuring the diffraction intensity at the position-sensitive detector.

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