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Testability apparatus and method for faster data access and sili

Static information storage and retrieval – Read/write circuit – Testing
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Testable nonvolatile semiconductor device

Static information storage and retrieval – Read/write circuit – Testing
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Testing a memory device having field effect transistors...

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Testing and repair of wide I/O semiconductor memory devices desi

Static information storage and retrieval – Read/write circuit – Testing
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Testing circuitry of internal peripheral blocks in a semiconduct

Static information storage and retrieval – Read/write circuit – Testing
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Testing device for testing a memory

Static information storage and retrieval – Read/write circuit – Testing
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Testing for SRAM memory data retention

Static information storage and retrieval – Read/write circuit – Testing
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Testing memory using a stress signal

Static information storage and retrieval – Read/write circuit – Testing
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Testing method and apparatus for dram

Static information storage and retrieval – Read/write circuit – Testing
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Testing method and device for non-volatile memories having a...

Static information storage and retrieval – Read/write circuit – Testing
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Testing method and test apparatus in semiconductor apparatus

Static information storage and retrieval – Read/write circuit – Testing
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Testing method for a semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
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Testing method for FIFOS

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Testing non-volatile memory devices for charge leakage

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Testing of embedded memory by coupling the memory to input/outpu

Static information storage and retrieval – Read/write circuit – Testing
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Testing parameters of an electronic device

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Testing parameters of an electronic device

Static information storage and retrieval – Read/write circuit – Testing
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Testing semiconductor devices for data retention

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Testing semiconductor memory device having test circuit

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Testing structure and method for high density PLDs which have fl

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