Data compression circuit and method for testing memory devices

Data compression circuit and method for testing memory devices

Data compression read mode for memory testing

Data compression read mode for memory testing

Data compression read mode for memory testing

Data compression read mode for memory testing

Data compression read mode for memory testing

Data invert jump instruction test for built-in self-test

Data output control circuit of semiconductor memory device havin

Data path having grounded precharge operation and test...

Data retention test for static memory cell

Data retention weak write circuit and method of using same

Data transfer circuit

Data transfer verification systems and methods

Data writing apparatus, data writing method, and tester

Design for test to emulate a read with worse case test pattern

Design of provably correct storage arrays

Designing memory for testability to support scan capability...

Detector circuit for testing semiconductor memory device

Determining history state of data based on state of...