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Sacrifice read test mode

Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate

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Sacrifice read test mode

Static information storage and retrieval – Read/write circuit – Testing
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Sacrifice read test mode

Static information storage and retrieval – Read/write circuit – Testing
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Scan register circuit for scanning data for determining...

Static information storage and retrieval – Read/write circuit – Testing
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Scheme to test/repair multiple large RAM blocks

Static information storage and retrieval – Read/write circuit – Testing
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Scratchpad memory

Static information storage and retrieval – Read/write circuit – Testing
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Screening processes for ferroelectric memory devices

Static information storage and retrieval – Read/write circuit – Testing
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SDRAM clocking test mode

Static information storage and retrieval – Read/write circuit – Testing
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Sector synchronized test method and circuit for memory

Static information storage and retrieval – Read/write circuit – Testing
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Selective application of voltages for testing storage cells in s

Static information storage and retrieval – Read/write circuit – Testing
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Selective application of voltages for testing storage cells in s

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Self burn-in circuit for semiconductor memory

Static information storage and retrieval – Read/write circuit – Testing
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Self contained array timing

Static information storage and retrieval – Read/write circuit – Testing
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Self-refresh test time reduction scheme

Static information storage and retrieval – Read/write circuit – Testing
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Self-repair of embedded memory arrays

Static information storage and retrieval – Read/write circuit – Testing
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Self-test circuit for memory integrated circuits

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Self-test circuit for memory integrated circuits

Static information storage and retrieval – Read/write circuit – Testing
Patent

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Self-test device for memories, decoders, etc.

Static information storage and retrieval – Read/write circuit – Testing
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Self-test of a memory device

Static information storage and retrieval – Read/write circuit – Testing
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Self-Test pattern to detect stuck open faults

Static information storage and retrieval – Read/write circuit – Testing
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