Margin-range apparatus for a sense amp's...
Measuring circuit for qualifying a memory located on a...
Memory access circuits for test time reduction
Memory addressing structural test
Memory apparatus with built-in parity generation
Memory array architecture and method for high-speed...
Memory array architecture and method for high-speed...
Memory array having a redundant memory element
Memory array organization and related test method...
Memory array organization and related test method...
Memory array sense amplifier test and characterization
Memory array test circuit and method
Memory array tester information processing system
Memory built in self test circuit and method for generating...
Memory built in self test circuit and method for generating...
Memory cell having a super supply voltage
Memory channel test fixture and method
Memory circuit
Memory circuit and method for processing a code to be loaded...
Memory circuit for performing threshold voltage tests on cells o