Testing parameters of an electronic device

Details Testing parameters of an electronic device Testing parameters of an electronic device

1997-11-04

1999-11-30

Nelms, David

Static information storage and retrieval

Read/write circuit

Testing

365233, 365203, G11C 700

Patent

active

059954264

ABSTRACT:
A method for testing an electronic device includes causing the device to perform an operation. Using circuitry of the device, a duration of time is asynchronously measured in association with the step of causing. The operation is controlled in response to the expiration of the duration.

REFERENCES:
patent: 5548560 (1996-08-01), Stephens, Jr. et al.
patent: 5754486 (1998-05-01), Nevill et al.
patent: 5757705 (1998-05-01), Manning
patent: 5809038 (1998-09-01), Martin

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