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EEPROM margin testing design

Static information storage and retrieval – Read/write circuit – Testing
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Efficient method for obtaining usable parts from a partially goo

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Efficient semiconductor burn-in circuit and method of operation

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Electrical fuse control of memory slowdown

Static information storage and retrieval – Read/write circuit – Testing
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Electrical test circuit with active-load and output sampling...

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Electrically erasable and programmable non-volatile and multi-le

Static information storage and retrieval – Read/write circuit – Testing
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Electrically modifiable non-volatile memory with write checking

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Electrically programmable memory matrix

Static information storage and retrieval – Read/write circuit – Testing
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Electrically programmable non-volatile semiconductor memory devi

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Electronic memory apparatus, and method for deactivating...

Static information storage and retrieval – Read/write circuit – Testing
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Electronic memory device

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Enabling memory redundancy during testing

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Enhanced method of testing semiconductor devices having nonvolat

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Enhancements in testing devices on burn-in boards

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Entire wafer stress test method for integrated memory devices an

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EPROM memory device having a test circuit

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Error detection and correction method and apparatus in a...

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Error detection on programmable logic resources

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Error test for an address decoder of a non-volatile memory

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