Semiconductor memory device with reset during a test mode
Semiconductor memory device with stress circuit and method for s
Semiconductor memory device with switching element for...
Semiconductor memory device with test mode and testing...
Semiconductor memory device with test mode decision circuit
Semiconductor memory device with testing function
Semiconductor memory device with testing of redundant memory cel
Semiconductor memory device, and method for testing the same
Semiconductor memory device, circuit board mounted with...
Semiconductor memory device, system and method of testing same
Semiconductor memory devices and methods of testing for...
Semiconductor memory devices and methods of testing for...
Semiconductor memory devices having a built-in test function
Semiconductor memory devices incorporating voltage level...
Semiconductor memory equipped with test circuit for testing data
Semiconductor memory having a dummy signal line connected to...
Semiconductor memory having a dummy signal line connected to...
Semiconductor memory having a test function
Semiconductor memory having an improved test circuit
Semiconductor memory having built-in test circuit