Semiconductor memory equipped with test circuit for testing data

Details Semiconductor memory equipped with test circuit for testing data Semiconductor memory equipped with test circuit for testing data

1986-04-09

1989-09-26

Moffitt, James W.

Static information storage and retrieval

Read/write circuit

Testing

365185, 36518903, 36518911, G11C 2900, G11C 700

Patent

active

048706183

ABSTRACT:
An electrically programmable read only memory including a plurality of memory cells each composed of a field effect transistor having a floating gate is disclosed. The memory is featured by a test circuit which has a first circuit responding to a first control signal to raise all word lines up to a programming voltage and a second circuit responding to a second control signal to raise all digit lines up to the programming voltage. It is thereby detected whether or not electrons injected into the floating gate of the programmed memory cell are carried away during a data programming operation period.

REFERENCES:
patent: 4489404 (1984-12-01), Yasuoka

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