Semiconductor memory having a test function

Details Semiconductor memory having a test function Semiconductor memory having a test function

1993-07-02

1994-03-08

Fears, Terrell W.

Static information storage and retrieval

Read/write circuit

Testing

36518901, 36523001, 371 101, G11C 1140, G11C 1300

Patent

active

052933415

ABSTRACT:
A first test mode signal generating circuit detects, at a timing at which a row address strobe signal changes from an inactive level, to an active level that a column address strobe signal and a write control signal are at an active level to generate an active first test mode signal. A control signal generating circuit detects, during a period in which the row address strobe signal is at the active level, that the column address strobe signal changes from an active level, through an inactive level, and to the active level again to generate an active control signal. A second test mode signal generating circuit generates an active second test mode signal when the first test mode signal and the control signal are at the active level. The first test circuit tests a memory circuit in response to output of the active first test mode signal, and a second test circuit tests the memory circuit in response to output of the active second test mode signal.

REFERENCES:
patent: 5243570 (1993-09-01), Saruwatari
English Abstracts of the Japanese Provisional Publication No.1 62-250593 (1987).
English Abstracts of the Japanese Provisional Publication No. 63-266695 (1988).

Affiliated with

Also associated with

Rating

Semiconductor memory having a test function does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory having a test function, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory having a test function will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-158092