Semiconductor memory devices and methods of testing for...

Details Semiconductor memory devices and methods of testing for... Semiconductor memory devices and methods of testing for...

2008-09-23

2008-09-23

Dinh, Son (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S189050, C365S189070, C365S236000

Reexamination Certificate

active

11526321

ABSTRACT:
A semiconductor memory device includes a flash memory, a buffer memory configured to receive expected data for testing for failed bits in the flash memory, and a failed bit control unit configured to receive the expected data from the buffer memory, to receive read data from the flash memory, and to calculate a failed bit number and a failed bit position from the expected data and the read data.

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