Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2008-09-23
2008-09-23
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189050, C365S189070, C365S236000
Reexamination Certificate
active
11526321
ABSTRACT:
A semiconductor memory device includes a flash memory, a buffer memory configured to receive expected data for testing for failed bits in the flash memory, and a failed bit control unit configured to receive the expected data from the buffer memory, to receive read data from the flash memory, and to calculate a failed bit number and a failed bit position from the expected data and the read data.
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Dinh Son
Myers Bigel & Sibley Sajovec, PA
Samsung Electronics Co,. Ltd.
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