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Test mode entrance through clocked addresses

Static information storage and retrieval – Read/write circuit – Testing
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Test mode flag signal generator of semiconductor memory device

Static information storage and retrieval – Read/write circuit – Testing
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Test mode for detecting a floating word line

Static information storage and retrieval – Read/write circuit – Testing
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Test mode for IPP current measurement for wordline defect...

Static information storage and retrieval – Read/write circuit – Testing
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Test of a semiconductor memory having a plurality of memory...

Static information storage and retrieval – Read/write circuit – Testing
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Test parallelism increase by tester controllable switching...

Static information storage and retrieval – Read/write circuit – Testing
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Test parallelism increase by tester controllable switching...

Static information storage and retrieval – Read/write circuit – Testing
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Test signal generator for semiconductor integrated circuit memor

Static information storage and retrieval – Read/write circuit – Testing
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Test structure for detecting bridging of DRAM capacitors

Static information storage and retrieval – Read/write circuit – Testing
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Test structure for measuring a junction resistance in a DRAM...

Static information storage and retrieval – Read/write circuit – Testing
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Test structures for measuring DRAM cell node junction...

Static information storage and retrieval – Read/write circuit – Testing
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Testability apparatus and method for faster data access and sili

Static information storage and retrieval – Read/write circuit – Testing
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Testable nonvolatile semiconductor device

Static information storage and retrieval – Read/write circuit – Testing
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Testing a memory device having field effect transistors...

Static information storage and retrieval – Read/write circuit – Testing
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Testing and repair of wide I/O semiconductor memory devices desi

Static information storage and retrieval – Read/write circuit – Testing
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Testing circuitry of internal peripheral blocks in a semiconduct

Static information storage and retrieval – Read/write circuit – Testing
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Testing device for testing a memory

Static information storage and retrieval – Read/write circuit – Testing
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Testing for SRAM memory data retention

Static information storage and retrieval – Read/write circuit – Testing
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Testing memory using a stress signal

Static information storage and retrieval – Read/write circuit – Testing
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Testing method and apparatus for dram

Static information storage and retrieval – Read/write circuit – Testing
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