Test mode entrance through clocked addresses
Test mode flag signal generator of semiconductor memory device
Test mode for detecting a floating word line
Test mode for IPP current measurement for wordline defect...
Test of a semiconductor memory having a plurality of memory...
Test parallelism increase by tester controllable switching...
Test parallelism increase by tester controllable switching...
Test signal generator for semiconductor integrated circuit memor
Test structure for detecting bridging of DRAM capacitors
Test structure for measuring a junction resistance in a DRAM...
Test structures for measuring DRAM cell node junction...
Testability apparatus and method for faster data access and sili
Testable nonvolatile semiconductor device
Testing a memory device having field effect transistors...
Testing and repair of wide I/O semiconductor memory devices desi
Testing circuitry of internal peripheral blocks in a semiconduct
Testing device for testing a memory
Testing for SRAM memory data retention
Testing memory using a stress signal
Testing method and apparatus for dram