Test mode flag signal generator of semiconductor memory device

Details Test mode flag signal generator of semiconductor memory device Test mode flag signal generator of semiconductor memory device

2005-09-27

2005-09-27

Dinh, Son T. (Department: 2824)

Static information storage and retrieval

Read/write circuit

Testing

C365S233100

Reexamination Certificate

active

06950357

ABSTRACT:
A test mode flag signal generator for use in a semiconductor memory device includes a test mode decoder for generating M numbers of test mode flag signals; and an auxiliary test mode flag signal generating means for generating M×2Nnumbers of test mode flag signals by using N numbers of external signals and the M numbers of test mode flag signals.

REFERENCES:
patent: 6373764 (2002-04-01), Fujioka
patent: 6519719 (2003-02-01), Manning

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