Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2005-08-09
2005-08-09
Nguyen, Van Thu (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S200000
Reexamination Certificate
active
06928011
ABSTRACT:
Electrical fuses (eFuses) are applied to the task of memory performance adjustment to improve upon earlier fuse techniques by not requiring an additional processing step and expensive equipment. Standard electrical fuse (eFuse) hardware chains provide a soft test feature wherein the effect of memory slow-down can be tested prior to actually programming the fuses. Electrical fuses thus provide a very efficient non-volatile method to match the logic-memory interface through memory trimming, drastically cutting costs and cycle times involved.
REFERENCES:
patent: 5912852 (1999-06-01), Lawrence et al.
patent: 5995424 (1999-11-01), Lawrence et al.
patent: 6373747 (2002-04-01), Harari et al.
Agarwala Sanjive
Graber Joel J.
Krishnan Manjeri
Le Duy-Loan
Sheffield Bryan
Marshall, Jr. Robert D.
Nguyen Tuan T.
Nguyen Van Thu
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