Static information storage and retrieval – Read/write circuit – Testing
Patent
1999-08-25
2000-08-01
Yoo, Do Hyun
Static information storage and retrieval
Read/write circuit
Testing
365226, G11C 700
Patent
active
060976470
ABSTRACT:
An integrated circuit memory device has multiple subarray partitions which can be independently isolated from the remaining circuitry on the integrated circuit. Subarrays of the integrated circuit can be independently tested. Should a subarray of the integrated circuit be found inoperable it is electrically isolated from the remaining circuitry on the integrated circuit so that it cannot interfere with the normal operation of the remaining circuitry. Defects such as power to ground shorts in a subarray which would have previously been catastrophic can be electrically isolated allowing the remaining functional subarrays to be utilized. Integrated circuit repair by isolation of inoperative elements eliminates the current draw and other performance degradations that have previously been associated with integrated circuits with defects repaired through the incorporation of redundant elements alone.
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Keeth Brent
Ong Adrian E.
Zagar Paul S.
Micro)n Technology, Inc.
Yoo Do Hyun
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