Static information storage and retrieval – Read/write circuit – Testing
Reexamination Certificate
2006-09-21
2009-02-24
Dinh, Son (Department: 2824)
Static information storage and retrieval
Read/write circuit
Testing
C365S189050
Reexamination Certificate
active
07495980
ABSTRACT:
An electrical test circuit includes a bridge configuration having two paths between two nodes, a buffer, and a capacitor. An output of the buffer is coupled to one of the paths, the buffer is adapted to either provide a defined potential or a high impedance, the capacitor is connected to the output of the buffer, and a signal of a device under test is adapted to be coupled to another one of the paths. One of the nodes of the bridge configuration can be supplied with a first current, and the other one of the nodes of the bridge configuration can be supplied with a second current.
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Dinh Son
Perman & Green LLP
Schoppe, Zimmerman, Stockeler & Zinkler
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