Sample electrification measurement method and charged...

Radiant energy – Inspection of solids or liquids by charged particles – Electron probe type

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C250S306000, C073S105000, C324S662000, C324S067000

Reexamination Certificate

active

06946656

ABSTRACT:
The present invention has the object of providing a charged particle beam irradiation method ideal for reducing the focus offset, magnification fluctuation and measurement length error in charged particle beam devices.To achieve these objects, a method is disclosed in the invention for measuring the electrical potential distribution on the sample with a static electrometer while loaded by a loader mechanism. Another method is disclosed for measuring the local electrical charge at specified points on the sample, and isolating and measuring the wide area electrostatic charge quantity from those local electrostatic charges. Yet another method is disclosed for correcting the measurement length value or magnification based on fluctuations found by measuring the amount of electrostatic charge at the specified points under at least two charged particle optical conditions, and then using a charged particle beam to measure fluctuations in measurement dimensions occurring due to fluctuations in the electrostatic charge at the specified locations.

REFERENCES:
patent: 5512747 (1996-04-01), Maeda
patent: 5723981 (1998-03-01), Hellemans et al.
patent: 5872358 (1999-02-01), Todokoro et al.
patent: 6635873 (2003-10-01), Todokoro et al.
patent: 4-181643 (1992-06-01), None
patent: 5-67667 (1993-03-01), None
patent: 5-151927 (1993-06-01), None
patent: 7-176285 (1995-07-01), None
patent: 9-145764 (1997-06-01), None
patent: 9-171791 (1997-06-01), None
patent: 11-126573 (1999-05-01), None
patent: 2000-200579 (2000-07-01), None
patent: 2001-52642 (2001-02-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Sample electrification measurement method and charged... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Sample electrification measurement method and charged..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Sample electrification measurement method and charged... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3389090

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.