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Area meter

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Area meter

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Arrangement for optic measuring of both width and thickness of a

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Assembly and method for making in process thin film thickness me

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Automated drill bit recognition system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automated inspection system for residual metal after chemical-me

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automated optical linewidth measurement

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Automated substrate pattern recognition system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic aperture size measurement apparatus and process

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Automatic circuit board tester

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic high speed optical inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic high speed optical inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic package inspection method

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic photomask inspection method and system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic photomask inspection system and apparatus

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
Patent

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Automatic photomask inspection system and apparatus

Optics: measuring and testing – By configuration comparison – With object being compared and light beam moved relative to...
Patent

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Automatic plate scanner

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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Automatic power controller

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate

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Automatic quality control measuring system for automotive assemb

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent

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Automatic rejection of diffraction effects in thin film metrolog

Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent

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