Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1988-07-06
1991-02-05
Scott, Jr., Leon
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356376, 356377, G01B 1100
Patent
active
049899813
ABSTRACT:
In order to accurately scan an object for the purposes of determining the dimensions, surface finish or the like, the position of the object according to the measuring system coordinate grid is determined. Using this orientation, the degree of misalignment with respect to a standard position on the grid is determined and the scanning devices which perform the actual measurement, are moved to positions which take the amount of misalignment into consideration and wherein accurate examination is assured.
REFERENCES:
patent: 4453827 (1984-06-01), Taboada
Kawamura Takaaki
Yamazaki Tomoyasu
Jr. Leon Scott
Nissan Motor Co,. Ltd.
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