Optics: measuring and testing – By configuration comparison – With photosensitive film or plate
Patent
1981-04-07
1983-04-12
Punter, William H.
Optics: measuring and testing
By configuration comparison
With photosensitive film or plate
250237R, G01B 1102
Patent
active
043796354
ABSTRACT:
Apparatus for automatically measuring aperture size of a slotted apertured material includes a means for supporting and transporting a slotted apertured material having a plurality of slots with each having a longitudinal axis and a comparator mask overlaying the apertured material and having alternate light transparent and opaque sectors, a light source and a light detector disposed on opposite sides of the slotted apertured material and having a light beam directed therethrough wherein a rhombic-shaped aperture controls the size and shape of the light beam impinging the detector whereby advancement of the rhombic-shaped aperture along a diagonal axis provides a reduced rate of change in light transmitted by the slots and received by the light detector whereby fluctuations in light transmission are reduced for random variations in mask placement.
REFERENCES:
patent: 4070117 (1978-01-01), Johannsmeier et al.
patent: 4349278 (1982-09-01), French et al.
patent: 4354761 (1982-10-01), Jacoby
Ragland, Jr., F. R., "Method of Measuring the Width of Apertures in a PI Shadow Mask", RCA Tech. Note, TN#1231, 9-6-79.
Buffton Thomas H.
GTE Laboratories Incorporated
Odozynski John A.
Punter William H.
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