Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1978-10-02
1980-12-23
Corbin, John K.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356398, 356237, G01B 1100
Patent
active
042407508
ABSTRACT:
An automatic printed circuit board tester in which a laser beam is directed onto and scanned around solder pads and foil regions of a printed circuit board, and errors in structure are determined by detecting patterns of scattered light and comparing these patterns with similarly obtained ones from a properly constructed board.
REFERENCES:
patent: 3753617 (1973-08-01), Ehrat
patent: 3909602 (1975-09-01), Micka
patent: 4065212 (1977-12-01), Belleson et al.
Hurd William A.
Kurtz Robert L.
Corbin John K.
Phillips C. A.
Rosenberger R. A.
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