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Cigarette end group inspection system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Comparator mask for aperture measuring apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Compensating system for inspecting potentially warped printed ci

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Defect detection through image comparison using relative...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Detection method using electromagnetic wave and detection...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Detection of phase defects on photomasks by differential...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Device for automatically determining the deviation between the s

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Electro-optical system for gauging surface profile deviations

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Electro-optical system for gauging surface profile deviations

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Electro-optical system for inspecting printed circuit boards

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Element recognition and orientation

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Exposure apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Exposure apparatus

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Exterior view inspecting apparatus for circuit board

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Fiber optic system including digital controller for fiber...

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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Galvanometer and camera system

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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High speed illumination system for microelectronics inspection

Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
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High speed pattern inspection method and system

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Illuminating and optical apparatus for inspecting soldering...

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Illumination system and method for generating an image of an obj

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