Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1979-08-07
1981-05-26
McGraw, Vincent P.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356387, G01B 1100
Patent
active
042695155
ABSTRACT:
A system for inspecting a printed circuit board constituted by an insulating board having a conductive pattern thereon which creates interconnections between circuit elements mounted on the board. In this system, a laser beam is deflected in the X and Y directions to generate a raster scan which is optically split in a manner making it possible to simultaneously examine corresponding sections of the conductive pattern on the board and on the artwork from which the board is derived. The artwork possesses the same scale and the same orientation as the desired conductive pattern on the board and therefore represents the nominal pattern required therefor. In this simultaneous examination, a comparison is made in an associated computer between the dimensions of the conductors in the pattern and the spacings therebetween on the board and on the artwork to determine the extent of the disparities therebetween.
REFERENCES:
patent: 3776995 (1973-12-01), Little, Jr.
patent: 4170401 (1979-10-01), Yoder et al.
Goedertier, P. V. "Inspection System For LSI Structures", RCA Tech. Notes, TN. No. 1221, 12-29-78.
Krochmann et al., "Automatic Vector Distance Comparator VDK Projektina", Feinwerk Technik & Messtechnik, vol. 84, 10, 11-76, pp. 330-334.
Altman Associates, Inc.
Ebert Michael
McGraw Vincent P.
Punter Wm. H.
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