Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1995-06-27
1997-03-25
Gonzalez, Frank
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356398, 356376, G01B 1100
Patent
active
056150130
ABSTRACT:
A system combines a galvanometer system with a camera to provide information from a workpiece to the camera. The galvanometer rotates mirrors to change the image that is directed from the workpiece into the camera. The inventive method allows the use of the camera to identify the location of points on the workpiece. Further, the system facilitates the use of the camera to store information about a pattern on a workpiece. Also, the system can be utilized to create a computer aided design file of the surface of a workpiece. The system is utilized in the last two methods to serially store bit by bit information about the workpiece in a memory.
REFERENCES:
patent: 4775235 (1988-10-01), Hecker et al.
patent: 5459794 (1995-10-01), Ninomiya
Rueb Kurt
Wong Andrew
Gonzalez Frank
Merlino Amanda
Virtek Vision Corp.
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