Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1995-08-16
1996-10-22
Pham, Hoa Q.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
356237, 356398, G01B 1100
Patent
active
055682642
ABSTRACT:
The exterior view inspecting apparatus for circuit board of the invention including a sensor unit for emitting a laser beam to an object to be inspected, and detecting the displacement of the object by focusing the reflected light on a photoelectric transducer by using a receiving lens; an optical path converter unit for refracting the optical path of the laser beam; a sensor head unit incorporating the sensor unit and optical path converter unit; a control unit for moving the sensor head unit along a specified scanning route; a correction unit for correcting the displacement data of the object to be inspected as detected by the sensor unit, and a judging unit for judging the existence and position of an electronic component on a circuit board from the corrected displacement data. The optical path converter unit includes a flat sheet glass inclined relative to the optical path of the laser beam, rotating about the axial center parallel to the optical path. By this optical path converter unit, the optical path of the laser beam is refracted so that the laser beam scans the circuit board drawing a small circular trace. As the trace draws a small circle, the trace detects the end portion of the electronic component on the circuit board multiple times. Consequently, the existence and position of the electronic component on the circuit board can be detected accurately.
REFERENCES:
patent: 3154626 (1964-10-01), Sisson
patent: 3210546 (1965-10-01), Perron
patent: 3589815 (1971-06-01), Hosterman
patent: 4240750 (1980-12-01), Kurtz et al.
patent: 5329359 (1994-07-01), Tachikawa
Koezuka et al., "High-Speed, Wide Area 3-D Vision System for PWB Inspection", Fujitsu Sci. Tech. Journal, 26, 1, pp. 16-25 (Apr. 1990).
Fujita Takayuki
Ichikawa Iwao
Kato Kenji
Morioka Manabu
Nakatsuka Shigeki
Matsushita Electric - Industrial Co., Ltd.
Pham Hoa Q.
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