Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Reexamination Certificate
2007-11-30
2009-06-02
Punnoose, Roy (Department: 2886)
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
C356S388000, C356S316000
Reexamination Certificate
active
07542140
ABSTRACT:
A detection apparatus includes a sample holding section, an irradiation means, a detection means, a calculation means, and an evaluation means. The irradiation means irradiates a substance held in the sample holding section with a THz wave. The detection unit detects a THz wave that has passed through or been reflected from the substance. The calculation unit determines a frequency dependence of a property of the substance with respect to the irradiated THz wave and then calculates a slope of a straight line or a slope of a straight line obtained by straight-line approximation of the frequency dependence of the property of the substance. The evaluation unit evaluates the state change of the substance by comparing a previously-obtained slope of a straight line of the frequency dependence of the property of the substance in a standard state and the slope of the straight line of the substance calculated.
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Kasai Shintaro
Ouchi Toshihiko
Yamashita Masatsugu
Yoneyama Haruko
Canon Kabushiki Kaisha
Fitzpatrick ,Cella, Harper & Scinto
Punnoose Roy
Riken
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