Optics: measuring and testing – By configuration comparison – With comparison to master – desired shape – or reference voltage
Patent
1988-05-24
1990-12-18
Rosenberger, Richard A.
Optics: measuring and testing
By configuration comparison
With comparison to master, desired shape, or reference voltage
358101, G02B 711, H01L 2166
Patent
active
049782207
ABSTRACT:
A compensating system for insepcting potentially warped printed circuit boards provides the insepction head of a printed circuit board inspection apparatus with a compensating device which is capable of detecting deviations in the printed circuit board which depart from a reference standard, for use in accurately compensating for such deviations during the board inspection procedure. An appropriate source (including ultrasonic, laser and directed light sources) is used to direct emissions toward the surface of a printed circuit board to be inspected. Detected reflections are then used to provide information useful in determining deviations of the surface of the printed circuit board from the reference standard, to adjust the anticipated locations for any component features, connecting leads or pins which are to be inspected within the subject viewing field.
REFERENCES:
patent: 4230940 (1980-10-01), Minami et al.
patent: 4331409 (1982-05-01), Cianci et al.
Abramovich Abe
Robertson Gordon I.
Cimflex Teknowledge Corporation
Rosenberger Richard A.
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