AC scan diagnostic method
Accelerated Galois data integrity crosscheck system and method
Accelerated Reed-Solomon error correction
Accelerated scan circuitry and method for reducing scan test...
Accelerated scan circuitry and method for reducing scan test...
Accelerated scan circuitry and method for reducing scan test...
Accelerated test method for ferroelectric memory device
Accelerating scan test by re-using response data as stimulus...
Accelerating scan test by re-using response data as stimulus...
Acceleration of convergence rate with verified bits in turbo...
Access control device and testing method
Access method for embedded JTAG TAP controller instruction...
Accessing sequential data in a microcontroller
Accessing sequential data in a microcontroller
Accessing sequential data in microcontrollers
Accessing test modes using command sequences
Accounting for error carryover in error correction on M-bit...
Accurately identifying failing scan bits in compression...
Achieving desired synchronization at sequential elements...
Achieving desired synchronization at sequential elements...