Access control device and testing method

Details Access control device and testing method Access control device and testing method

2005-08-30

2005-08-30

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Testing of error-check system

C714S724000

Reexamination Certificate

active

06938191

ABSTRACT:
The present invention provides an access control device and a testing method that can simplify the software operations in an access control operation such as a JTAG control operation, and enable the hardware to perform a high-speed control operation. The access control device conducts a test or diagnosis on an object by accessing a serial interface based on a command and data that specify a testing or diagnosing route. Under the control of a processor, a control circuit in the access control device executes an access sequence in accordance with a command string and an input data string stored in a memory, and stores the data outputted from the object to be tested or diagnosed in the memory as an output data string. The control circuit sets a state transition route for each objective state in advance, so that a transition route can be readily determined for an objective state specified by the command string.

REFERENCES:
patent: 5377198 (1994-12-01), Simpson et al.
patent: 11-282717 (1999-10-01), None

Affiliated with

Also associated with

Rating

Access control device and testing method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Access control device and testing method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Access control device and testing method will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3451390