Semiconductor memory device having data holding mode using...

Semiconductor memory device having deterioration determining fun

Semiconductor memory device having deterioration determining...

Semiconductor memory device having deterioration determining...

Semiconductor memory device having ECC type error recovery...

Semiconductor memory device having scan flip-flops

Semiconductor memory device having test address generating...

Semiconductor memory device having test mode

Semiconductor memory device having time reduced in testing...

Semiconductor memory device including a signal control...

Semiconductor memory device parallel bit test circuits

Semiconductor memory device provided with error correcting...

Semiconductor memory device requiring performance of...

Semiconductor memory device storing repair information...

Semiconductor memory device testable with a single data rate...

Semiconductor memory device with a test mode

Semiconductor memory device with an on-chip error correction...

Semiconductor memory device with built-in self test circuit...

Semiconductor memory device with data scramble circuit

Semiconductor memory device with error correction