Semiconductor memory device having ECC type error recovery...

Details Semiconductor memory device having ECC type error recovery... Semiconductor memory device having ECC type error recovery...

2005-02-01

2005-02-01

Decady, Albert (Department: 2133)

Error detection/correction and fault detection/recovery

Pulse or data error handling

Digital data error correction

C714S006130

Reexamination Certificate

active

06851081

ABSTRACT:
A semiconductor memory device having an error check and correction (ECC) type error recovery circuit in which disposition of ECC cells is improved. The memory device comprises: a memory cell array including a plurality of normal cell array portions and an ECC cell array portion; an X decoder for selecting one of word lines in the memory cell array, the word lines extending from the X decoder to the memory cell array; an ECC operation circuit for performing error check and correction based on cell data read out from a selected word line, the cell data including data from normal cells and ECC cells of the selected word line. The ECC memory cell array portion is disposed at a location other than the far end of the word lines from the X decoder, that is, the ECC cell array portion is disposed at a location in which read out speed of data from ECC cell or cells does not become the worst speed in the memory device. Therefore, the worst data read out speed can be measured from outside.

REFERENCES:
patent: 6070262 (2000-05-01), Kellogg et al.
patent: 6216247 (2001-04-01), Creta et al.
patent: 6397290 (2002-05-01), Williams et al.
patent: 62-003498 (1987-01-01), None
patent: 2539950 (1989-07-01), None
patent: 04-335300 (1992-11-01), None
patent: 05-298895 (1993-11-01), None
patent: 06-203596 (1994-07-01), None
patent: 6-338199 (1994-12-01), None
patent: 8-222639 (1996-08-01), None
patent: 10-222995 (1998-08-01), None
patent: 10-326497 (1998-12-01), None
Japanese Office Action dated Dec. 18, 2003.
Partial English translation of Japanese Office Action dated Dec. 18, 2003.

Affiliated with

Also associated with

Rating

Semiconductor memory device having ECC type error recovery... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor memory device having ECC type error recovery..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor memory device having ECC type error recovery... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3457673